4H-SiC MOSFET中界面碳团簇的形成和迁移率退化机理Interfacial Carbon Cluster Formation and Mobility Degradation in 4H-SiC MOSFETs张召富武汉大学工业科学研究院研究员ZHANG ZhaofuProfessor of The Institute of Technological Sciences, Wuhan University

无损表征氮化镓外延热物性的瞬态热反射技术Transient thermoreflectance technique for non-invasively characterizing the thermal properties of GaN epitaxial wafer袁超武汉大学工业科学研究院研究员YUAN ChaoProfessor of The Institute of Technological Sciences, Wuhan University